Powder X-ray diffraction (XRD) is an established method for qualitative characterization of ceramic materials. Accurate quantitative information can be extracted from XRD data by a data processing ...
Study focused on AlSi10Mg and Ti-6Al-4V – replicated the kinds of conditions directly relevant to aerospace, transport and ...
Researchers from IMDEA Materials and the Carlos III University of Madrid (UC3M), in collaboration with research institutes in ...
Abstract: X-ray metrology, a nondestructive characterization technique, was used to evaluate the warpage induced in a silicon (Si) wafer on a substrate with a predefined warpage. Section topography ...